The institute is equipped with excellent laboratory facilities. Here you find a short overview of the available instruments and labs.

Overview: Laboratories


Overview of the Main Measurement Equipment

  • Micro- and Millimeterwave Measurement Instrumentation
    • 8-port full duplex Vector Signal Transceiver (VST) up to 6 GHz with a Bandwidth of 80 MHz (based on NI PXIe‑5645R)
    • Phase noise measurement with AnaPico APPH20G for signals up to 26 GHz
    • Signal and spectral analyzer up to 8 GHz (R&S FSW-8)
    • 2-Port VNA with complete frequency coverage up to 500 GHz (e.g. Rohde & Schwarz ZVA with ZVA-Z90/110/170/220/325/500)
    • Differential "True Mode" 2-Port network analysis / Single-Ended 4-port analysis up to 67 GHz (e.g. Agilent PNA-X 67 GHz)
    • Spectral analysis up to 850 GHz
    • Noise measurements (incl. 1/f-Noise)
    • Materialcharacterisation up to 325 GHz
    • Antenna measurments
    • Modular Mixed-Signal-Testsystem
    • Analysis capability of signalintegrity issues and signalpath characterization in time and frequency domain
    • Time domain measurements reaching to the pico second range
    • PCB measurements for signalintegrity and material characterisation
  • THz Equipement:
    • Quasi-optical measurement instrumentations up to 2.5 THz
    • Electromagnetic field sampling system
    • THz-Short pulse system (Menlo Systems Tera K15)
  • Technologies
    • Development and fabrication of dielectric waveguides
    • Development and fabrication of refractors and mirrors
    • Development and fabrication of polarisation gratings
    • Laser structuring of microwave PCB laminates
    • Electro plating shop
    • Bonding station
    • Powerful micromechanical work shop
  • Photonics and Lightwave Measurement Instrumentation
    • Optical spectral analyzer 600 nm ... 1700 nm (e.g. Yokogawa AQ6370)
    • Broadband tunable laser sources (e.g. Agilent 81600)
    • Super-continuum white light source (Koheras SuperK Compact)
    • Erbium-doped fiber amplifiers, ytterbium fiber laser, femtosecond fiber laser
    • Fusion splicers for standard and specialty fibers (Ericson FSU995, Fitel S176 + S183)
    • Polarisation measurement instrumentation, Stokes polarimeter
    • Optical power detectors from UV to FIR, from 100 fW up to 200 W
    • IR beam diagnostics, beam quality measurement

Embedded Wireless Laboratory

Embedded Wireless Laboratory

Characterization of an amplifier in the Embedded Wireless Laboratory

Together with LTE and IDC, LHFT has established a unique interdisciplinary laboratory - The Laboratory for Embedded Wireless Systems. Front ends, Mixed Signal Circuits and DSPs are no longer developed independently. They can now be characterized and evaluated within the system under realistic use.


Antenna-Laboratory

Example of an antenna verification

Example of an antenna verification

In order to precisely characterize antennas the LHFT has an anechoic chamber (6x4 m2) incooperating a 4-axis positioning roboter. Beside the capability to measure the radiation pattern in elevation and azimut direction, also area-scans in the near- and far-field are possible. Antenna gain measurements are possible with available standard gain antennas. Signal generation and analysis is possible up to 500 GHz.


Network Analysis Lab

Beispiel einer On-Wafer Messung

Example of an On-Wafer measurement

The institute has an excellently equipped VNA laboratory with two on-wafer-probe stations. "True Mode" differential 2-Port measurements are possible up to a frequency of 67 GHz. 2-Port measurements reaching from 10 MHz up to 110 GHz can be done in a single sweep (Agilent PNA-X 67 GHz with frequency extender) incooperating 1 mm coaxial connectors. The on-wafer-stations allow for a temperature dependent characterization of DUTs in the wide range from -40°C to 120°C.


THz Laboratory

Quasi-optischer Aufbau zur Charakterisierung eines 600 GHz Schottky-Diodenmischers

Quasi-optical Setup fort the characterization of a 600 GHz fundamental Schottky diode mixer

Materialcharakterisierung mit THz-Kurzpulssystem bis 2,5 THz

Material characterization with a THz short pulse system up to 2.5 THz

For developing and characterizing of sub-mmW components and systems the institutes has a dedicated THz laboratory. Leveraging quasi-optical setups, THz-components up to 2.5 THz can be analyzed. For this reason BWOs, mixer and detectors reaching up to 600 GHz are available. A rich set of passive components such as mirrors, polarizer, quasi-optical multiplexers, refractors and dielectric waveguides are completing the required prerequisites. Imaging and NDT can be done utilizing a laser based short pulse system, covering frequencies up to 2.5 THz.


Radar Imaging Laboratory

Quasi-optischer Aufbau zur Charakterisierung eines 600 GHz Schottky-Diodenmischers

SAR - Reconstruction of a mmW image

Planarer Aufbau einer Messung 75 GHz - 100 GHz

Field measurement system at 150 GHz

In the field of radar imaging LHFT develops high performant microwave components, systems and complex signal processing. For optimization and verification of systems and algorithms various 2D scanning stages are available. The main focus in this area is on systems for security, non destructive testing and material characterization


Robotic Laboratory

Two Stäubli TX90XL robots with a working space of 1.400 mm

Two Stäubli TX90XL robots with a working space of 1.400 mm

The two Stäubli 6-axis robots are used to study new wireless localization algorithms and can also be utilized for material inspection and characterization of arbitrarily shaped objects. The two robots can operate fully synchronized. Working space is up to 1.400 mm with a payload of 14 kg each. Positioning accuracy is in the sub-millimeter region. Positioning is software controlled to provide a collision free operation.


MRI/EPR Laboratory

2 Tesla magnet with resonators for EPR experiments

2 Tesla magnet with resonators for EPR experiments

Close up of EPR-resonator placed in magnetic field

Close up of EPR-resonator placed in magnetic field

LHFT is equipped with extensive equipment for "Magnetic Resonance Imaging" (MRI) and "Electron Paramagnetic Resonance" (EPR) experiments. The 2 Tesla magnet was specifically built for laboratory EPR experiments. In the paramagnetic resonance method, the measured absorption spectrum is due to resonance of the electron spin instead of the nucleus in MRI.

Fiber Laser Laboratory

Frequency-doubled raman fiber laser for generation of a yellow laser beam

Frequency-doubled raman fiber laser for generation of a yellow laser beam

  • Ytterbium fiber lasers (boxed and modular systems)
  • Raman fiber lasers
  • Crystals for second harmonic generation
  • Beam quality measurement setup
  • IR beam diagnostics
  • Optical power sensors from UV to FIR

Fiber Optics and Photonics Laboratory

Setup for the measurement of non-linear fiber optic effects (Brillouin, Raman, Four-wave mixing)

Setup for the measurement of non-linear fiber optic effects (Brillouin, Raman, Four-wave mixing)

  • Optical spectrum analyzers, 600 nm ... 1700 nm (e.g. Yokogawa AQ6370)
  • Fusion splicers for standard and specialty fibers (Ericsson FSU995, Fitel S176, Fitel S183)
  • Tunable laser sources (z.B. Agilent 81600)
  • Erbium-doped fiber amplifiers (EDFAs)
  • Polarisation diagnostics, Stokes polarimeter
  • Optical phase and amplitude modulators up to 20 GHz
  • Microwave test and measurement equipment

Faser Bragg Grating Laboratory

FBG writing station wwith UV excimer laser and the scanning phase-mask method

FBG writing station wwith UV excimer laser and the scanning phase-mask method

  • KrF excimer laser Coherent Bragg-Star Industrial (248 nm, 1 kHz, 10 mJ)
  • FBG writing station by the scanning phase-mask method
  • Super continuum white light source Koheras SuperK Compact
  • Broadband light sources (SLD, ASE sources)
  • Optical spectrum analyzers 600nm ... 1700 nm (e.g. Yokogawa AQ6370)
  • Hydrogen loading pressure chamber for silica fibers (100% H2, 200 bar, 150°C)
  • Climate chamber for temperature and strain sensing tests

Laser Spectroscopy Lab

Spectrometer system for the test of different diode lasers as light sources for gas analysis

Spectrometer system for the test of different diode lasers as light sources for gas analysis

  • Tunable laser sources (z.B. Agilent 81600)
  • Tunable DFB- und VCSEL diode lasers wwith controllers
  • Reference absorption gas cells and vacuum eqipment
  • Wavemeters (Burleigh Wavemeter WA-1100)
  • Low-noise photo detectors and amplifiers, lock-in detection